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Spectra-Physics Mai Tai HP DeepSee
The Mai Tai® DeepSee™ Ti:Sapphire oscillator with Spectra-Physics' patented automated dispersion compensation has been specifically optimized for use in multiphoton microscopy. The Mai Tai DeepSee laser delivers the industry's highest peak power to the sample thus maximizing the fluorescence signal.
For more information, please visit http://www.spectra-physics.com
An average power of over 2.4W
The Mai Tai DeepSee laser offers over 2.4 W of average power and 350 nm (690-1040 nm) in useable tuning range. For access to longer wavelengths beyond 1040 nm, Spectra-Physics offers InSight DS+ with the widest tuning range (680-1300 nm) for deepest in vivo imaging
Reliability
The Mai Tai DeepSee oscillator’s reliability is maintained through the ultra-stable regenerative mode locking technique developed by Spectra-Physics. With hands free, drop-out free wavelength tuning, excitation profiles can be quickly collected with just the click of a mouse
Real-time monitoring technology
StabiLok® real-time monitoring technology also enhances system reliability by providing excellent beam pointing stability and minimal average power fluctuations, as well as eliminating wavelength drift.
Deeper penetration depths
With the Mai Tai DeepSee oscillator, deeper penetration depths can be achieved without the risk of sample damage from increased average powers. Whenever ultrafast laser pulses are transmitted through optical materials (i.e. windows, lenses, and non-linear crystals), the added dispersion lengthens the pulse width. This pulse lengthening has a negative affect on the fluorescence signal obtained. The Mai Tai DeepSee option corrects in advance for the optical setup dispersion through pre-compensation, which maximizes the observed fluorescence signals. If the danger of sample damage prevents the average power from being increased, then delivering the highest peak power is the only way to increase the fluorescence.
Applications
- Multiphoton microscopy
- Time-resolved photoluminescence
- Non-linear spectroscopy
- Optical computed tomography
- Surface second harmonic generation
- Terahertz imaging
- Semiconductor metrology
- Materials processing
- Amplifier seeding
| Peak Power (applies to 800 nm only) | >266 kW |
|---|---|
| Pulse Width | <100 fs |
| Tuning Range4 | 690–1040 nm |
| Average Power (applies to 800 nm only) | >2.1 W |
| Peak Power, Alternative Wavelengths | >56 kW at 690 nm |
| >150 kW at 710 nm | |
| >150 kW at 920 nm | |
| >34 kW at 1040 nm | |
| Beam Roundness (applies to 800 nm only) | 0.9–1.1 |
| Astigmatism (applies to 800 nm only) | <25% |
| Repetition Rate | 80 MHz ±1 MHz |
| Beam Pointing Stability | <50 µrad/100 nm |
| Noise | <0.15% |
| Stability | <±1% |
| Spatial Mode (applies to 800 nm only) | TEMoo, M2 <1.1 |
| Polarization (applies to 800 nm only) | >500:1 horizontal |
| Beam Divergence (applies to 800 nm only) | <1.2 mrad |
| Beam Diameter (1/e²) (applies to 800 nm only) | <1.2 mm |
| Standard Dispersion Compensation Range | 690 nm: -22,500 fs2 to -41,700 fs2 |
| 800 nm: -8,900 fs2 to -24,500 fs2 | |
| 1040 nm: 0 fs2 to -9,600 fs2 |
